UA Pine Bluff’s scanning electron microscope setup has the following key specifications:
- Magnification range 20-45,000x
- Long-lifetime high-brightness source
- 5kV and 10 kV acceleration voltages for high resolution images
- Sample loading in less than 30 seconds
- Full color navigation camera
- Very low energy consumption
If you would like to contact this core facility, please fill out the "Facility Contact Form" on the right of this page. This contact method helps ARA measure the success of the CFE in connecting potential collaborators and will flow directly to the core director’s email inbox.