Scanning Electron Microscope
The Scanning Electron Microscope is located at the University of Arkansas Pine Bluff.
Key specifications
UA Pine Bluff’s scanning electron microscope setup has the following key specifications:
- Magnification range 20-45,000x
- Long-lifetime high-brightness source
- 5kV and 10 kV acceleration voltages for high resolution images
- Sample loading in less than 30 seconds
- Full color navigation camera
- Very low energy consumption