UA Pine Bluff, Photoluminescence (PL) Measurement System

The temperature-dependent PL setup can characterize the bandgap energy of semiconducting and nanoscale optoelectronic materials at different temperatures from 10 K to 350 K. The spectrometer and detectors are appropriate to measure the PL spectra in a broad range from 600 nm to 5000 nm covering from visible to far infrared. Two lasers, including 532 nm and 1064 nm lasers are the source of excitations.

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